Added the ability to copy and paste develop brush and other local non-destructive adjustments.Added ability to right-click on the embed-pending overlay icon to give quick access to the Embed ACDSee Metadata and Clear Embed Pending Flag commands.Added the ability to clear the flag which indicates a file has ACDSee database information not yet embedded into a file.Grouped metadata related commands into a new Metadata sub menu under the Tools menu.Introduced option to not have the 'Tagged' ACDSee Metadata value influence the embed pending flag.Added the ability to apply a sequence number to metadata of selected files or to a metadata preset.Introduced thumbnail icon that indicates when a file has ACDSee metadata assigned which is not embedded in the image (embed-pending overlay icon).Easily search for and filter for images that have no keywords assigned.Ability to toggle state of thumbnail overlay icons with shortcut keys.Can import and export metadata presets for easy sharing between different computers.Allow ability to zoom in on image in Geometry tab of Develop mode.Introduced OpenCL processing in the RAW processing pipeline.Ability to specify order of external editors list.
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Name of folders can be shown when file names are hidden (Tools | Options | File List | Thumbnail Info).Added support for Samsung maker notes in EXIF metadata.Added support for EXIF, IPTC, and embedded ACDSee metadata to PSD files.Performance improvements made to the Repair Tool.
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